The isophotic metric and its application to feature sensitive morphology on surfaces
Publication (Report)
by Helmut Pottmann, Tibor Steiner, Michael Hofer, C. Haider, Allan Hanbury
January 2003
Reference
Pottmann, H., Steiner, T., Hofer, M., Haider, C., & Hanbury, A. (2003). The isophotic metric and its application to feature sensitive morphology on surfaces. http://hdl.handle.net/20.500.12708/31621
